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Dr. Ram D. Sriram (NIST): SI Metrology: Ensuring the Reliability of Super Intelligence
November 6 @ 1:00 pm - 2:00 pm
This week, we are hosting a joint seminar with IFH. Our presenter is Dr. Ram D. Sriram, a Senior Science Advisor in the Information Technology Laboratory at NIST. The details of his talk are added below.
Please note the special location for this Seminar.
Friday, November 6, 2026, 1:00 PM – 2:00 PM
ISEB Auditorium, UC IrvineĀ
Zoom Link: https://uci.zoom.us/s/
Zoom Meeting ID: 995 5848 3214
Light refreshments will be provided.
Title: SI Metrology: Ensuring the Reliability of Super Intelligence
Abstract
As super intelligence becomes embedded in everyday life, rigorous methods for measuring and evaluating SI systems are essential. This talk introduces SI metrology, the emerging science of assessing the accuracy, reliability, and trustworthiness of SI models. Drawing on applications in healthcare and manufacturing, it covers uncertainty quantification, neuro-symbolic computing, and the role of SI in advancing measurement science.
Bio
Dr. Ram D. Sriram is a Senior Science Advisor in the Information Technology Laboratory at NIST, where he previously led the Software and Systems Division. Before joining NIST, he served on the engineering faculty at MIT. His research spans super intelligence, knowledge-based systems, and health informatics. He is a Fellow of ACM, IEEE, and AAAS.
